Title :
Improvement in in-plane localization precision of nanoparticles using interference analysis
Author :
Meiri, Amihai ; Ebeling, Carl G. ; Martineau, Jason ; Zalevsky, Zeev ; Gerton, Jordan M. ; Menon, Rajesh
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Utah, Salt Lake City, UT, USA
Abstract :
We present a method to improve the localization precision of nanoparticles over Gaussian fitting by imposing an interference pattern on the Point-Spread-Function. Localization precision of 0.1nm for a single emitter was obtained.
Keywords :
Gaussian processes; light interference; nanoparticles; nanophotonics; optical transfer function; Gaussian fitting; in-plane localization precision; interference pattern analysis; nanoparticles; point-spread-function; Cities and towns; Fitting; Gratings; Image resolution; Interference; Microscopy; Nanoparticles;
Conference_Titel :
Lasers and Electro-Optics (CLEO), 2015 Conference on
Conference_Location :
San Jose, CA
