Title :
EV Charging Facilities and Their Application in LV Feeders With Photovoltaics
Author :
Marra, F. ; Yang, G.Y. ; Traeholt, Chresten ; Larsen, Esben ; Ostergaard, Jacob ; Blazic, Bostjan ; Deprez, Wim
Author_Institution :
Electr. Eng. Dept., Tech. Univ. of Denmark (DTU), Lyngby, Denmark
Abstract :
Low-voltage (LV) grid feeders with high penetration of photovoltaics (PVs) are often affected by voltage magnitude problems. To solve such issues, previous research has shown that reactive power methods, active power curtailment and grid reinforcement can be used for voltage support, yet showing several limits. We introduce the use of electric vehicle (EV) public charging stations with energy storage system (ESS) as a solution for voltage regulation in LV feeders with PV. A novel method is proposed to determine the ESS charging load required for voltage regulation and compare the results for the different locations in the feeder. With time-series simulations, we quantify the energy size required for a station ESS. A Belgian LV residential grid, modeled using real PV generation and load profiles, is used as case study. The method and simulation results show the effectiveness of using public EV charging facilities with the additional function of voltage regulation in feeders with PV.
Keywords :
electric power generation; electric vehicles; energy storage; power grids; reactive power; secondary cells; time series; voltage control; Belgian LV residential grid; ESS charging load; EV charging facilities; EV public charging stations; LV grid feeders; PV generation; active power curtailment; electric vehicle; energy storage system; grid reinforcement; load profiles; low-voltage grid feeders; photovoltaics; reactive power methods; time-series simulations; voltage magnitude problems; voltage regulation; Batteries; Energy states; Load modeling; Photovoltaic systems; Reactive power; Sensitivity; Voltage control; Electric vehicle; energy storage; low voltage grids; photovoltaics; voltage regulation;
Journal_Title :
Smart Grid, IEEE Transactions on
DOI :
10.1109/TSG.2013.2271489