DocumentCode :
733420
Title :
Active resonance wavelength stabilization for silicon microring resonators using slope-detection with an inresonator defect-state-absorption-based photodetector
Author :
Yu Li ; Poon, Andrew W.
Author_Institution :
Dept. of Electron. & Comput. Eng., Hong Kong Univ. of Sci. & Technol., Hong Kong, China
fYear :
2015
fDate :
10-15 May 2015
Firstpage :
1
Lastpage :
2
Abstract :
We demonstrate active resonance wavelength stabilization for silicon microrings with an in-resonator BF2-implanted photodetector using a slope-detection method. Our experiment reveals active resonance wavelength stabilization with ~1dB transmission intensity variations upon a 7oC 10mHz modulation.
Keywords :
defect states; elemental semiconductors; infrared spectra; micro-optomechanical devices; micromechanical resonators; microsensors; optical modulation; optical resonators; photodetectors; silicon; Si; active resonance wavelength stabilization; in-resonator BF2-implanted photodetector; in-resonator defect-state-absorption-based photodetector; modulation; silicon microring resonators; slope-detection method; transmission intensity variations; Current measurement; Microprocessors; Optical resonators; Photoconductivity; Silicon; Temperature measurement; Tuners;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics (CLEO), 2015 Conference on
Conference_Location :
San Jose, CA
Type :
conf
Filename :
7183859
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=733420
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