• DocumentCode
    733600
  • Title

    Frequency instability and phase noise characterization of an integrated chip-scale optomechanical oscillator

  • Author

    Yongjun Huang ; Jiagui Wu ; Xingsheng Luan ; Shu-Wei Huang ; Mingbin Yu ; Guoqiang Lo ; Dim-Lee Kwong ; Guangjun Wen ; Chee Wei Wong

  • Author_Institution
    Mesoscopic Opt. & Quantum Electron. Lab., Univ. of California at Los Angeles, Los Angeles, CA, USA
  • fYear
    2015
  • fDate
    10-15 May 2015
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    We characterize the frequency instability and single-sideband phase noise of chip-scale optomechanically-driven oscillators, with integrated Ge photoreceivers. At 400-μ\\ν, an open-loop frequency instability at 10-8 is observed, with -125 dBc/Hz phase noise at 10-kHz offset.
  • Keywords
    elemental semiconductors; frequency stability; germanium; integrated optics; integrated optoelectronics; micro-optomechanical devices; optical receivers; oscillators; phase noise; Ge; integrated chip-scale optomechanical oscillator; integrated photoreceivers; open-loop frequency instability; power 400 muW; single-sideband phase noise; Microelectronics; Nanostructures; Optics; Physics; Radiofrequency integrated circuits; Roads;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics (CLEO), 2015 Conference on
  • Conference_Location
    San Jose, CA
  • Type

    conf

  • Filename
    7184041
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=733600