DocumentCode :
733737
Title :
Inspection of defect-induced mode coupling in hollow-core photonic bandgap fibers using time-of-flight
Author :
Wong, Nicholas H. L. ; Sandoghchi, S. Reza ; Yongmin Jung ; Bradley, Tom ; Wheeler, Natalie V. ; Baddela, N.K. ; Hayes, John R. ; Poletti, F. ; Petrovich, Marco N. ; Alam, Shaif-Ul ; Petropoulos, Periklis ; Richardson, David J.
Author_Institution :
Optoelectron. Res. Centre, Univ. of Southampton, Southampton, UK
fYear :
2015
fDate :
10-15 May 2015
Firstpage :
1
Lastpage :
2
Abstract :
We analyze defect-induced mode coupling in a hollow-core photonic bandgap fiber using time-of-flight, and show its utility in complementing optical time-domain reflectometry.
Keywords :
optical fibre couplers; optical fibre testing; optical time-domain reflectometry; photonic band gap; defect-induced mode coupling; hollow-core photonic bandgap fibers; optical inspection; optical time-domain reflectometry; time-of-flight; Couplings; Delays; Optical fiber amplifiers; Optical fiber communication; Optical fiber dispersion; Optical fiber polarization;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics (CLEO), 2015 Conference on
Conference_Location :
San Jose, CA
Type :
conf
Filename :
7184179
Link To Document :
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