Title :
A spectrally resolved lateral-shearing interferometer for measurement of relative group delay using a periodic entrance slit in a spectrometer
Author :
Bahk, S.-W. ; Dorrer, C. ; Roides, R.G. ; Bromage, J.
Author_Institution :
Lab. for Laser Energetics, Univ. of Rochester, Rochester, NY, USA
Abstract :
A concept for a spectrally resolved lateral-shearing interferometer is proposed to measure pulse front and radial group delay. A periodic slit in a spectrometer enables a simpler spatial interference scheme than a Mach-Zehnder interferometer.
Keywords :
high-speed optical techniques; light interference; light interferometry; optical delay lines; optical testing; Mach-Zehnder interferometer; periodic entrance slit; pulse front measurement; radial group delay measurement; relative group delay measurement; spatial interference scheme; spectrally resolved lateral-shearing interferometer; spectrometer; Delays; Interference; Laser beams; Measurement by laser beam; Optical interferometry; Phase frequency detector; Structural beams;
Conference_Titel :
Lasers and Electro-Optics (CLEO), 2015 Conference on
Conference_Location :
San Jose, CA
