• DocumentCode
    734293
  • Title

    Model checking of finite-state machine-based scenario-aware dataflow using timed automata

  • Author

    Skelin, Mladen ; Wognsen, Erik Ramsgaard ; Olesen, Mads Chr ; Hansen, Rene Rydhof ; Larsen, Kim Guldstrand

  • Author_Institution
    Dept. of Eng. Cybern., Norwegian Univ. of Sci. & Technol., Trondheim, Norway
  • fYear
    2015
  • fDate
    8-10 June 2015
  • Firstpage
    1
  • Lastpage
    10
  • Abstract
    Dataflow formalisms are widely used for modeling and analyzing streaming applications. An important distinction is between static and dynamic formalisms, the latter allowing for the workload to change on-the-fly. The recently introduced finite-state machine based scenario aware dataflow (FSM-SADF) is a dynamic dataflow formalism that increases the expressiveness of the static synchronous dataflow (SDF) formalism, by allowing finite-state control, while to a large extent retaining its design-time analyzability. This paper reports on the translation of the FSM-SADF formalism to UPPAAL timed automata that enables a more general verification than currently supported by existing tools. We base our translation on a compositional approach where the input FSM-SADF model is represented as a parallel composition of its integral components modeled as automata. Thereafter, we show how to model check quantitative and qualitative properties both supported and not supported by the existing tools. We demonstrate our approach on a realistic case study from the multimedia domain.
  • Keywords
    data flow computing; finite state machines; formal verification; FSM-SADF model; SDF formalism; UPPAAL timed automata; dynamic dataflow formalism; finite-state control; finite-state machine-based scenario aware dataflow; model checking; parallel composition; scenario aware dataflow; static synchronous dataflow formalism; streaming application analysis; Automata; Computational modeling; Detectors; Kernel; Presses; Semantics; Switches;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Embedded Systems (SIES), 2015 10th IEEE International Symposium on
  • Conference_Location
    Siegen
  • Type

    conf

  • DOI
    10.1109/SIES.2015.7185065
  • Filename
    7185065