DocumentCode :
734606
Title :
Transistor noise characterization for an SKA low-noise amplifier
Author :
Shaw, R.D. ; Hay, S.G.
Author_Institution :
CSIRO, Marsfield, NSW, Australia
fYear :
2015
fDate :
13-17 April 2015
Firstpage :
1
Lastpage :
4
Abstract :
Noise parameter measurements of six candidate transistors for a Square Kilometer Array (SKA) low-noise amplifier (LNA) are presented. They provide reliable data in the frequency range where some low-noise transistors are inadequately characterized. The results of these measurements inform the design of an LNA for SKA1-Survey Band 2 with measured minimum noise temperature of 21 K.
Keywords :
low noise amplifiers; SKA low-noise amplifier; SKA1-Survey Band 2; noise parameter measurements; square kilometer array low-noise amplifier; transistor noise characterization; Arrays; Frequency measurement; Noise; Noise measurement; Temperature measurement; Transistors; Transmission line measurements; Square Kilometer Array; low-noise amplifier; noise parameters;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Antennas and Propagation (EuCAP), 2015 9th European Conference on
Conference_Location :
Lisbon
Type :
conf
Filename :
7228365
Link To Document :
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