Title :
Holographic principles in antenna metrology at millimeter and submillimeter wavelengths
Author :
Raisanen, Antti V. ; Ala-Laurinaho, Juha
Author_Institution :
Dept. of Radio Sci. & Eng., Sch. of Electr. Eng., Aalto Univ., Espoo, Finland
Abstract :
Holographic principles used in antenna metrology at millimeter and submillimeter wavelengths are discussed. Holographic principles may be applied, e.g., in determining the surface accuracy of large reflectors, in phase retrieval in nearfield antenna measurements, in antenna pattern retrieval through input reflection coefficient measurement with reflective load in near-field, or in producing the plane wave conditions for the measurement (a hologram based compact antenna test range).
Keywords :
antenna radiation patterns; electromagnetic wave reflection; holography; millimetre wave antennas; millimetre wave propagation; near-field communication; reflector antennas; submillimetre wave antennas; submillimetre wave propagation; antenna pattern retrieval; holographic principle; millimeter wavelength; nearfield antenna measurement; phase retrieval; reflection coefficient measurement; reflective load; reflector; submillimeter wavelength; Antenna measurements; Extraterrestrial measurements; Holography; Microwave antennas; Phase measurement; Reflector antennas; THz; antenna; hologram; holography; measurement; millimeter wave; submillimeter wave;
Conference_Titel :
Antennas and Propagation (EuCAP), 2015 9th European Conference on
Conference_Location :
Lisbon
