Title :
On path loss measurement and modeling for millimeter-wave 5G
Author :
Peter, Michael ; Keusgen, Wilhelm ; Weiler, Richard J.
Author_Institution :
Fraunhofer Heinrich Hertz Inst., Berlin, Germany
Abstract :
This paper addresses the derivation of path loss models and model parameters based on measurement data, in particular with a view to current modeling work for 5G millimeter-wave systems. In order to ensure accurate and comparable results, which are independent from the measurement hardware, it is of utmost importance to incorporate a sufficiently large data set and use a coherent data processing including spatial averaging.
Keywords :
5G mobile communication; loss measurement; 5G millimeter-wave systems; coherent data processing; measurement hardware; model parameters; path loss measurement; path loss models; spatial averaging; Bandwidth; Data models; Fading; Loss measurement; Millimeter wave measurements; Niobium; Standards;
Conference_Titel :
Antennas and Propagation (EuCAP), 2015 9th European Conference on
Conference_Location :
Lisbon