DocumentCode :
734986
Title :
Timing-resilient Network-on-Chip architectures
Author :
Panteloukas, Alexandros ; Psarras, Anastasios ; Nicopoulos, Chrysostomos ; Dimitrakopoulos, Giorgos
Author_Institution :
Electr. & Comput. Eng., Democritus Univ. of Thrace, Xanthi, Greece
fYear :
2015
fDate :
6-8 July 2015
Firstpage :
77
Lastpage :
82
Abstract :
Networks-on-Chip (NoC) have been established as the de facto standard for on-chip communication in multi-/many-core systems, due to their innate scalability properties pertaining to performance and physical implementation. Spanning the entire chip, the NoC suffers from both inter-die and intra-die variations. In addition to static variability, the NoC is also afflected by dynamic variations, such as fast VDD droops, temperature, and aging effects. Such variations cause unpredictable behavior in the timing characteristics of the NoC components, which need significant timing margins to ensure always-correct operation. Consequently, the potential for high-frequency operation is impeded. In this paper, we propose a timing-error-resilient mechanism called TRNoC, which allows the NoC to operate at higher frequencies, at the expense of sporadically experiencing run-time timing errors, which are handled by an error recovery strategy. TRNoC includes a lightweight timing-error detection mechanism, together with a distributed error recovery mechanism, which allow for lossless operation, while leaving the error-free parts of the network unaffected. Hardware implementation results demonstrate the efficiency of TRNoC and its potential as a scalable timing-error-resilient NoC architecture.
Keywords :
integrated circuit design; network-on-chip; TRNoC; aging effects; always-correct operation; distributed error recovery mechanism; dynamic variations; error recovery strategy; fast VDD droops; high-frequency operation; inter-die variation; intra-die variation; lightweight timing-error detection mechanism; lossless operation; many-core systems; multicore systems; on-chip communication; run-time timing errors; static variability; timing characteristics; timing-error-resilient mechanism; timing-resilient network-on-chip architectures; Clocks; Delays; Detectors; Ports (Computers); Registers; Switches;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
On-Line Testing Symposium (IOLTS), 2015 IEEE 21st International
Conference_Location :
Halkidiki
Type :
conf
DOI :
10.1109/IOLTS.2015.7229836
Filename :
7229836
Link To Document :
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