Title :
A 3.07μm2/bitcell physically unclonable function with 3.5% and 1% bit-instability across 0 to 80°C and 0.6 to 1.2V in a 65nm CMOS
Author :
Jiangyi Li ; Mingoo Seok
Author_Institution :
Columbia Univ., New York, NY, USA
Abstract :
This paper presents a circuitry for physically unclonable function, generating a unique and stable key for security-oriented applications. The key is generated from an array of pairs of voltage-compensated proportional-to-absolute-temperature generators. The difference between two analog outputs of a pair is voltage- and temperature-compensated yet sensitive mostly only to random threshold-voltage variation. As compared to the state of the art [3-4], the proposed design has an 8.3× smaller bitcell or 3.66× higher robustness against noise and environmental variations.
Keywords :
CMOS integrated circuits; cryptography; integrated circuit reliability; CMOS integrated circuit; analog output difference; physically unclonable function; security oriented applications; size 65 nm; stable key generation; temperature 0 C to 80 C; voltage 0.6 V to 1.2 V; voltage compensated proportional-to-absolute temperature generator; Arrays; Generators; High definition video; Robustness; Temperature measurement; Temperature sensors; Voltage measurement;
Conference_Titel :
VLSI Circuits (VLSI Circuits), 2015 Symposium on
Conference_Location :
Kyoto
Print_ISBN :
978-4-86348-502-0
DOI :
10.1109/VLSIC.2015.7231276
