• DocumentCode
    735277
  • Title

    A 3.07μm2/bitcell physically unclonable function with 3.5% and 1% bit-instability across 0 to 80°C and 0.6 to 1.2V in a 65nm CMOS

  • Author

    Jiangyi Li ; Mingoo Seok

  • Author_Institution
    Columbia Univ., New York, NY, USA
  • fYear
    2015
  • fDate
    17-19 June 2015
  • Abstract
    This paper presents a circuitry for physically unclonable function, generating a unique and stable key for security-oriented applications. The key is generated from an array of pairs of voltage-compensated proportional-to-absolute-temperature generators. The difference between two analog outputs of a pair is voltage- and temperature-compensated yet sensitive mostly only to random threshold-voltage variation. As compared to the state of the art [3-4], the proposed design has an 8.3× smaller bitcell or 3.66× higher robustness against noise and environmental variations.
  • Keywords
    CMOS integrated circuits; cryptography; integrated circuit reliability; CMOS integrated circuit; analog output difference; physically unclonable function; security oriented applications; size 65 nm; stable key generation; temperature 0 C to 80 C; voltage 0.6 V to 1.2 V; voltage compensated proportional-to-absolute temperature generator; Arrays; Generators; High definition video; Robustness; Temperature measurement; Temperature sensors; Voltage measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Circuits (VLSI Circuits), 2015 Symposium on
  • Conference_Location
    Kyoto
  • Print_ISBN
    978-4-86348-502-0
  • Type

    conf

  • DOI
    10.1109/VLSIC.2015.7231276
  • Filename
    7231276