Title :
Profiting from IoT: The key is very-large-scale happiness integration
Author :
Yano, Kazuo ; Akitomi, Tomoaki ; Ara, Koji ; Watanabe, Junichiro ; Tsuji, Satomi ; Sato, Nobuo ; Hayakawa, Miki ; Moriwaki, Norihiko
Author_Institution :
Research and Development Group, Hitachi, Ltd., Kokubunji, Tokyo, Japan
Abstract :
Big data without link to value is merely a cost. We have studied how to profit from data with Internet-of-Things technologies for over 10 years to reach the answer: the Wearable Happiness Meter. It allows us to integrate the measure of both wellbeing and productivity of 7-billion people worldwide, which was the dream of the 18th-century philosopher Jeremy Bentham, numeration of the greatest happiness of the greatest number to measure the right and wrong. Knowing right and wrong with the 10x speed over conventional financial feedback accelerates the growth of the enterprise, the economy, and the individual to maximize the worldwide happiness. Here the integration is not only on a chip, but in the distributed massive chips embedded in the society.
Keywords :
Big data; Indexes; Organizations; Productivity; Reliability; Wearable sensors;
Conference_Titel :
VLSI Circuits (VLSI Circuits), 2015 Symposium on
Conference_Location :
Kyoto, Japan
Print_ISBN :
978-4-86348-502-0
DOI :
10.1109/VLSIC.2015.7231287