• DocumentCode
    735995
  • Title

    Nose tip localization on a three dimensional face across pose, expressions and occlusions variations in a Riemannian context

  • Author

    Bentaieb, Samia ; Ouamri, Abdelaziz ; Keche, Mokhtar

  • Author_Institution
    Signals & Images Lab., Univ. of USTOMB, Oran, Algeria
  • fYear
    2015
  • fDate
    25-27 May 2015
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    Nose tip localization is an important step for registration, preprocessing and recognition of 3D face data. In this paper, we propose a new approach for the nose tip detection that is robust to pose and expression variations and in presence of occlusions. From a rotated 3D face, we extract facial curves that are matched to a profile curve model. An optimal matching using the Riemannian geometry, based on the Elastic Shape Analysis is performed to obtain the accurate nose tip. The proposed method requires no training and can locate the nose tip in less than 6 seconds. Experiments are performed on the Bosphorus database. Quantitative analysis and comparison with the ground truth locations are provided. The results confirm that our approach achieves 97.68% with error no larger than 12 mm and 98.19% within 20 mm.
  • Keywords
    computational geometry; face recognition; feature extraction; image matching; image registration; pose estimation; 3D face data preprocessing; 3D face data recognition; 3D face data registration; Bosphorus database; Riemannian geometry; elastic shape analysis; expression variations; facial curve extraction; ground truth locations; nose tip detection; nose tip localization; occlusion variations; optimal image matching; pose variations; profile curve model; quantitative analysis; rotated 3D face; three-dimensional face; Databases; Face; Face recognition; Nose; Robustness; Shape; Three-dimensional displays; Nose Tip Localization; SRVF; Shape Analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Control, Engineering & Information Technology (CEIT), 2015 3rd International Conference on
  • Conference_Location
    Tlemcen
  • Type

    conf

  • DOI
    10.1109/CEIT.2015.7233159
  • Filename
    7233159