Title :
Experimental demonstration of a tunable Marchand balun at K band in Silicon Germanium (SiGe) technology
Author :
Boglione, Luciano ; Goodman, Joel
Author_Institution :
Naval Res. Lab., Washington, DC, USA
Abstract :
This paper demonstrates the operation of a Marchand balun prototype in a standard Silicon process that can switch its operation between 2 adjacent regions of the K band. Pass gate CMOS switches connect or disconnect additional lengths of line in the windings of the balun to change the balun´s frequency response while maintaining its mixed mode performance. Digital control of the balun is enabled by the CMOS switches. The balun is fabricated in a high performance SiGe BiCMOS process built on standard 180 nm CMOS technology and characterized in terms of mixed mode scattering parameters. A broad instantaneous bandwidth is demonstrated with relative long gate length MOS devices. The authors believe that this is the first experimental demonstration of a balun tunable by pass gate switches in the high region of the microwave range.
Keywords :
BiCMOS integrated circuits; CMOS integrated circuits; Ge-Si alloys; baluns; silicon compounds; BiCMOS; CMOS switches; K band; Marchand balun; SiGe; digital control; size 180 nm; Bandwidth; Impedance matching; Logic gates; Ports (Computers); Scattering parameters; Silicon; Switches; Tunable circuits and devices; integrated circuits; microwave measurement; passive circuits;
Conference_Titel :
Wireless and Microwave Circuits and Systems (WMCS), 2015 Texas Symposium on
Conference_Location :
Waco, TX
DOI :
10.1109/WMCaS.2015.7233199