DocumentCode :
737550
Title :
Direct Measurement of VCSEL Transverse Mode Correlation and k_{math\\rm {\\mpn}}
Author :
Lavrencik, Justin ; Pavan, Sriharsha Kota ; Haupt, David K. ; Ralph, Stephen E.
Author_Institution :
Georgia Inst. of Technol., Atlanta, GA, USA
Volume :
27
Issue :
19
fYear :
2015
Firstpage :
2031
Lastpage :
2034
Abstract :
The correlation properties of vertical-cavity surface-emitting laser (VCSEL) transverse modes determine the noise impairments of VCSEL-based high-speed links. The crosscorrelation statistics between VCSEL mode pairs and the autocorrelation statistics for each VCSEL mode are directly measured using real-time 40GSs synchronous observations of spatially separated modes. Anticorrelation was found to be different for different mode pairs along with some positive correlations between modes, contradicting the assumptions of the IEEE model for mode partition noise in VCSEL multimode fiber links. These correlation results are used to estimate the mode partition parameter kmpn yielding different values of kmpn for the same VCSEL at the same bias, again in contrast with the IEEE model assumption.
Keywords :
laser beams; laser modes; laser noise; optical communication equipment; optical correlation; optical fibre communication; surface emitting lasers; IEEE model assumption; VCSEL mode pairs; VCSEL multimode fiber links; VCSEL transverse mode correlation; VCSEL-based high-speed links; anticorrelation; autocorrelation statistics; correlation properties; cross-correlation statistics; direct measurement; kmpn; mode partition noise; mode partition parameter; noise impairments; positive correlations; real-time 40GSs synchronous observations; vertical-cavity surface-emitting laser transverse mode; Correlation; Noise; Optical fiber communication; Optical fiber dispersion; Optical fibers; Standards; Vertical cavity surface emitting lasers; Vertical cavity surface emitting lasers; laser noise; optical communication;
fLanguage :
English
Journal_Title :
Photonics Technology Letters, IEEE
Publisher :
ieee
ISSN :
1041-1135
Type :
jour
DOI :
10.1109/LPT.2015.2449653
Filename :
7150336
Link To Document :
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