Title :
Reaching the Limit of Nonprofiling DPA
Author :
Hajra, Suvadeep ; Mukhopadhyay, Debdeep
Author_Institution :
Dept. of Comput. Sci. & Eng., Indian Inst. of Technol. Kharagpur, Kharagpur, India
fDate :
6/1/2015 12:00:00 AM
Abstract :
Many profiling differential power analysis (DPA) attacks estimate the multivariate probability distribution using a profiling step, and thus, can optimally combine the leakages of multiple sample points. Though there exist several approaches like filtering or principal component analysis for combining the leakages of multiple sample points in nonprofiling DPA, their optimality has been rarely studied. We study the issue of optimally combining the leakages of multiple sample points in nonprofiling DPA attacks using a linear function. In this paper, we introduce a multivariate leakage model based on some observations obtained by profiling the power traces of Advanced Encryption Standard (AES) encryption on Virtex-5 field programmable gate array (FPGA) device. Then, we use the introduced multivariate leakage model to propose optimal combining functions for nonprofiling DPA. The theoretical claims are supported by experimental evidence. We have also discussed different sides of the proposed combining functions in various practical scenarios.
Keywords :
cryptography; field programmable gate arrays; principal component analysis; probability; FPGA device; Virtex-5 field programmable gate array; advanced encryption standard; differential power analysis attacks; multiple sample points; multivariate leakage model; multivariate probability distribution; nonprofiling DPA; principal component analysis; profiling step; Computational modeling; Correlation; Predictive models; Random variables; Signal to noise ratio; Stochastic processes; Vectors; Correlation Power Analysis; Correlation power analysis (CPA); DFT; Differential Power Analysis; Principal Component Analysis; Side Channel Analysis; differential power analysis (DPA); discrete Fourier transform (DFT); filtering; principal component analysis (PCA); side channel analysis;
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
DOI :
10.1109/TCAD.2014.2387830