DocumentCode
737740
Title
Reaching the Limit of Nonprofiling DPA
Author
Hajra, Suvadeep ; Mukhopadhyay, Debdeep
Author_Institution
Dept. of Comput. Sci. & Eng., Indian Inst. of Technol. Kharagpur, Kharagpur, India
Volume
34
Issue
6
fYear
2015
fDate
6/1/2015 12:00:00 AM
Firstpage
915
Lastpage
927
Abstract
Many profiling differential power analysis (DPA) attacks estimate the multivariate probability distribution using a profiling step, and thus, can optimally combine the leakages of multiple sample points. Though there exist several approaches like filtering or principal component analysis for combining the leakages of multiple sample points in nonprofiling DPA, their optimality has been rarely studied. We study the issue of optimally combining the leakages of multiple sample points in nonprofiling DPA attacks using a linear function. In this paper, we introduce a multivariate leakage model based on some observations obtained by profiling the power traces of Advanced Encryption Standard (AES) encryption on Virtex-5 field programmable gate array (FPGA) device. Then, we use the introduced multivariate leakage model to propose optimal combining functions for nonprofiling DPA. The theoretical claims are supported by experimental evidence. We have also discussed different sides of the proposed combining functions in various practical scenarios.
Keywords
cryptography; field programmable gate arrays; principal component analysis; probability; FPGA device; Virtex-5 field programmable gate array; advanced encryption standard; differential power analysis attacks; multiple sample points; multivariate leakage model; multivariate probability distribution; nonprofiling DPA; principal component analysis; profiling step; Computational modeling; Correlation; Predictive models; Random variables; Signal to noise ratio; Stochastic processes; Vectors; Correlation Power Analysis; Correlation power analysis (CPA); DFT; Differential Power Analysis; Principal Component Analysis; Side Channel Analysis; differential power analysis (DPA); discrete Fourier transform (DFT); filtering; principal component analysis (PCA); side channel analysis;
fLanguage
English
Journal_Title
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher
ieee
ISSN
0278-0070
Type
jour
DOI
10.1109/TCAD.2014.2387830
Filename
7003988
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