• DocumentCode
    737781
  • Title

    Design and Performance Analysis of a 866-MHz Low-Power Optimized CMOS LNA for UHF RFID

  • Author

    Li, Jie ; Hasan, S. M. Rezaul

  • Author_Institution
    Center for Res. in Analog & VLSI Microsyst. dEsign (CRAVE), Massey Univ., Albany, New Zealand
  • Volume
    60
  • Issue
    5
  • fYear
    2013
  • fDate
    5/1/2013 12:00:00 AM
  • Firstpage
    1840
  • Lastpage
    1849
  • Abstract
    An optimized 866 MHz CMOS LNA for UHF radio-frequency identification reader is presented. It achieves simultaneous impedance and minimum Fmin noise matching at a very low-power drain of 850 μW from a 0.7-V supply voltage. Compared to other GHz LNA designs, this UHF LNA design using sub-1 V supply voltage is quite challenging due to the inductor size and bias drain-related noise factor degradation. The LNA was fabricated using the 130-nm IBM CMOS process. Compared to previously reported narrow-band LNA designs, inclusion of the finite gds effect is found to improve the nanometric design optimization. The low-cost packaged LNA was tested using external lumped element and microstrip line matching. The LNA delivered a power gain (S21) of ≈17 dB and an input power reflection (S11 @ 866 MHz) of ≈ -30 dB. It had a minimum pass-band noise figure of around 2.2 dB and a third-order input-referred intercept point of ≈ -11.5 dBm.
  • Keywords
    CMOS integrated circuits; UHF amplifiers; inductors; low noise amplifiers; low-power electronics; lumped parameter networks; microstrip lines; optimisation; radiofrequency identification; IBM CMOS process; UHF RFID; UHF radiofrequency identification reader; bias drain-related noise factor degradation; external lumped element; frequency 866 MHz; inductor size; low-cost packaged LNA; low-power drain; low-power optimized CMOS LNA; microstrip line matching; nanometric design optimization; narrow-band LNA designs; noise matching; power 850 muW; simultaneous impedance; size 130 nm; voltage 0.7 V; voltage 1 V; Impedance matching; Inductors; Logic gates; Noise; Optimization; Radiofrequency identification; Resistance; CMOS LNA; VLSI; impedance matching; intelligent wireless systems; narrow-band; noise matching; radio-frequency identification (RFID);
  • fLanguage
    English
  • Journal_Title
    Industrial Electronics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0046
  • Type

    jour

  • DOI
    10.1109/TIE.2012.2190953
  • Filename
    6169991