DocumentCode :
737791
Title :
Analysis and Enhancement of Low-Voltage Ride-Through Capability of Brushless Doubly Fed Induction Generator
Author :
Tohidi, Sajjad ; Oraee, Hashem ; Zolghadri, Mohammad Reza ; Shao, Shiyi ; Tavner, Peter
Author_Institution :
Dept. of Electr. Eng., Sharif Univ. of Technol. (SUT), Tehran, Iran
Volume :
60
Issue :
3
fYear :
2013
fDate :
3/1/2013 12:00:00 AM
Firstpage :
1146
Lastpage :
1155
Abstract :
This paper discusses the dynamic behavior of the brushless doubly fed induction generator during the grid faults which lead to a decrease in the generator´s terminal voltage. The variation of the fluxes, back EMFs, and currents are analyzed during and after the voltage dip. Furthermore, two alternative approaches are proposed to improve the generator ride-through capability using crowbar and series dynamic resistor circuits. Appropriate values for their resistances are calculated analytically. Finally, the coupled circuit model and the generator´s speed and reactive power controllers are simulated to validate the theoretical results and the effectiveness of the proposed solutions. Moreover, experiments are performed to validate the coupled circuit model used.
Keywords :
angular velocity control; asynchronous generators; brushless machines; coupled circuits; electric potential; machine control; power generation faults; power grids; reactive power control; resistors; back EMF; brushless doubly fed induction generator; coupled circuit model; crowbar; dynamic behavior; flux variation; generator ride-through capability improvement; grid faults; low-voltage ride-through capability analysis; low-voltage ride-through capability enhancement; reactive power controller; series dynamic resistor circuits; speed controller; terminal voltage; voltage dip; Power system stability; Reactive power; Resistance; Rotors; Transient analysis; Voltage fluctuations; Windings; Brushless doubly fed induction generator (BDFIG); feasibility region; ride-through; voltage dip;
fLanguage :
English
Journal_Title :
Industrial Electronics, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0046
Type :
jour
DOI :
10.1109/TIE.2012.2190955
Filename :
6169995
Link To Document :
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