DocumentCode :
737970
Title :
Solder Paste Scooping Detection by Multilevel Visual Inspection of Printed Circuit Boards
Author :
Benedek, Csaba ; Krammer, Oliver ; Janoczki, M. ; Jakab, Laszlo
Author_Institution :
Distrib. Events Anal. Res. Lab., Comput. & Autom. Res. Inst., Budapest, Hungary
Volume :
60
Issue :
6
fYear :
2013
fDate :
6/1/2013 12:00:00 AM
Firstpage :
2318
Lastpage :
2331
Abstract :
In this paper, we introduce an automated Bayesian visual inspection framework for printed circuit board (PCB) assemblies, which is able to simultaneously deal with various shaped circuit elements (CEs) on multiple scales. We propose a novel hierarchical multi-marked point process model for this purpose and demonstrate its efficiency on the task of solder paste scooping detection and scoop area estimation, which are important factors regarding the strength of the joints. A global optimization process attempts to find the optimal configuration of circuit entities, considering the observed image data, prior knowledge, and interactions between the neighboring CEs. The computational requirements are kept tractable by a data-driven stochastic entity generation scheme. The proposed method is evaluated on real PCB data sets containing 125 images with more than 10 000 splice entities.
Keywords :
Bayes methods; inspection; optimisation; printed circuits; solders; CE; PCB assemblies; automated Bayesian visual inspection framework; circuit elements; computational requirements; data-driven stochastic entity generation scheme; global optimization process; hierarchical multimarked point process model; image data; multilevel visual inspection; multiple scales; printed circuit boards; real data sets; scoop area estimation; solder paste scooping detection; splice entities; Feature extraction; Hidden Markov models; Histograms; Inspection; Printed circuits; Soldering; Marked point process (MPP); printed circuit board (PCB); scooping;
fLanguage :
English
Journal_Title :
Industrial Electronics, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0046
Type :
jour
DOI :
10.1109/TIE.2012.2193859
Filename :
6179524
Link To Document :
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