• DocumentCode
    738012
  • Title

    Pose and Expression Independent Facial Landmark Localization Using Dense-SURF and the Hausdorff Distance

  • Author

    Sangineto, E.

  • Author_Institution
    Pattern Anal. & Comput. Vision (PAVIS), Ist. Italiano di Tecnol., Genoa, Italy
  • Volume
    35
  • Issue
    3
  • fYear
    2013
  • fDate
    3/1/2013 12:00:00 AM
  • Firstpage
    624
  • Lastpage
    638
  • Abstract
    We present an approach to automatic localization of facial feature points which deals with pose, expression, and identity variations combining 3D shape models with local image patch classification. The latter is performed by means of densely extracted SURF-like features, which we call DU-SURF, while the former is based on a multiclass version of the Hausdorff distance to address local classification errors and nonvisible points. The final system is able to localize facial points in real-world scenarios, dealing with out of plane head rotations, expression changes, and different lighting conditions. Extensive experimentation with the proposed method has been carried out showing the superiority of our approach with respect to other state-of-the-art systems. Finally, DU-SURF features have been compared with other modern features and we experimentally demonstrate their competitive classification accuracy and computational efficiency.
  • Keywords
    face recognition; feature extraction; image classification; 3D shape models; DU-SURF; DU-SURF features; Hausdorff distance; SURF-like features; competitive classification accuracy; computational efficiency; dense-SURF; expression independent facial landmark localization; facial feature points localization; lighting conditions; local classification errors; local image patch classification; nonvisible points; plane head rotations; pose independent facial landmark localization; Detectors; Face; Feature extraction; Shape; Three dimensional displays; Vectors; Facial feature detection; Hausdorff distance; efficient feature extraction; head pose estimation;
  • fLanguage
    English
  • Journal_Title
    Pattern Analysis and Machine Intelligence, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0162-8828
  • Type

    jour

  • DOI
    10.1109/TPAMI.2012.87
  • Filename
    6180175