• DocumentCode
    738092
  • Title

    Effect of Glass Frits Amount on Atmospheric Sintering Behavior and Characteristics of Electrode Produced by Copper–Phosphorus Alloy

  • Author

    Adachi, Shuichiro ; Yoshida, Yutaka ; Nojiri, Takeshi ; Kurata, Yasushi ; Kato, Takahiko ; Watanabe, Seiichi ; Yoshida, Masato

  • Author_Institution
    Tsukuba Res. Lab., Hitachi Chem. Co., Ltd., Tsukuba, Japan
  • Volume
    5
  • Issue
    5
  • fYear
    2015
  • Firstpage
    1325
  • Lastpage
    1334
  • Abstract
    In this study, we evaluate the atmospheric sintering behavior and characteristics of electrodes produced by copper-phosphorus (Cu-P) alloy paste containing various amounts of B2O3-Bi2O3-SiO2 glass frits. We demonstrate the need for a certain extent of glass frits to expand the applicable temperature for use of Cu-P alloy paste shifted to the higher temperature side, where commercial pastes for crystalline silicon (Si) photovoltaics are sintered, although the minimum electrical resistivity of the Cu-P alloy electrode increased by increasing the amount of glass frits. Based on the characteristics of the Cu-P alloy electrode, the need to expand the Cu crystal network and prevent the oxidization of generated Cu has emerged to reduce electrical resistivity. A crystalline BiPO4 was formed in the sintered Cu-P alloy electrode, which suggests a reaction between partially crystallized glass frits and P2O5 generated from Cu-P-O glass derived from the Cu-P alloy that has occurred. Subsequently, the sintering behavior of Cu-P alloy paste, including the glass frits, was discussed based on the results of X-ray diffraction, transmission electron microscopy, scanning transmission electron microscopy energy-dispersive X-ray spectroscopy, and electron energy loss spectroscopy.
  • Keywords
    X-ray chemical analysis; X-ray diffraction; bismuth compounds; borosilicate glasses; copper alloys; crystallisation; electrical resistivity; electron energy loss spectra; elemental semiconductors; phosphorus alloys; scanning-transmission electron microscopy; silicon; sintering; solar cells; B2O3-Bi2O3-SiO2; Cu crystal network; Cu-P alloy electrode characteristics; CuP; EDX; EELS; STEM; Si; X-ray diffraction; XRD; atmospheric sintering behavior; copper-phosphorus alloy paste; crystalline silicon photovoltaics; electron energy loss spectroscopy; energy-dispersive X-ray spectroscopy; minimum electrical resistivity; partially crystallized glass frits; scanning transmission electron microscopy; Electrodes; Glass; Metals; Resistance; Scanning electron microscopy; Silicon; Temperature measurement; Atmospheric sintering; copper–phosphorus (Cu–P) alloy; copper???phosphorus (Cu???P) alloy; electrode; glass frit; silicon (Si) solar cells;
  • fLanguage
    English
  • Journal_Title
    Photovoltaics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    2156-3381
  • Type

    jour

  • DOI
    10.1109/JPHOTOV.2015.2449655
  • Filename
    7155477