Title :
A Fast Prototyping Framework for Analog Layout Migration With Planar Preservation
Author :
Po-Cheng Pan ; Ching-Yu Chin ; Hung-Ming Chen ; Tung-Chieh Chen ; Chin-Chieh Lee ; Jou-Chun Lin
Author_Institution :
Dept. of Electron. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan
Abstract :
Analog layout generation in the advanced CMOS design is challenging by its increasing layout constraints and performance requirements. This situation becomes more intricate by the growing parasitic variability and manufacturing reliability. To facilitate the feasibility of template-based layout migration, this paper first introduces a layout preservation, which extracts placement and routing behaviors from an existing layout into a crossing graph via constrained Delaunay triangulation. And later this crossing graph can be migrated into multiple layouts with placement and routing reconnection. The proposed approach also provides a refinement for wire to optimize the performance metrics. This approach is applied to a variable-gain amplifier, a folded-cascode operational amplifier, and a low dropout regulator. The experimental results demonstrate more possibility on layout migration, such that averagely more than 75% routing of migrated layout is generated by our approach. Additionally, it exhibits the productivity with qualified performance on different designs.
Keywords :
CMOS integrated circuits; integrated circuit design; integrated circuit layout; integrated circuit reliability; operational amplifiers; CMOS design; Delaunay triangulation; analog layout generation; analog layout migration; folded-cascode operational amplifier; low dropout regulator; planar preservation; template-based layout migration; variable-gain amplifier; Compaction; Correlation; Layout; Routing; Topology; Video recording; Wires; AMS circuit design; layout migration; low dropout (LDO) regulator; low dropout regulator; placement & routing; placement and routing; prototyping; slicing tree; trangulation; triangulation;
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
DOI :
10.1109/TCAD.2015.2418312