DocumentCode :
738458
Title :
An Output Matching Technique for a GaN Distributed Power Amplifier MMIC Using Tapered Drain Shunt Capacitors
Author :
Dong-Wook Kim
Author_Institution :
Dept. of Radio Sci. & Eng., Chungnam Nat. Univ., Daejeon, South Korea
Volume :
25
Issue :
9
fYear :
2015
Firstpage :
603
Lastpage :
605
Abstract :
This letter proposes an effective output matching technique using drain shunt capacitors with tapered capacitance values for a GaN distributed power amplifier MMIC to simultaneously obtain optimum load impedance for maximum output power of each transistor and phase velocity balance between input and output artificial transmission lines as well as length reduction of the transmission lines. To support its plausibility, a 2-6 GHz 10 W distributed power amplifier MMIC is designed and fabricated using a 0.25 μm GaN HEMT process of WIN Semiconductors. Measurement of the S parameters and CW output power demonstrates successful operation of the proposed technique in the design frequency range.
Keywords :
III-V semiconductors; MMIC power amplifiers; S-parameters; capacitors; gallium compounds; high electron mobility transistors; transmission lines; wide band gap semiconductors; GaN; GaN HEMT process; GaN distributed power amplifier MMIC; S parameter measurement; WIN Semiconductors; artificial transmission lines; frequency 2 GHz to 6 GHz; optimum load impedance; output matching technique; phase velocity balance; power 10 W; size 0.25 mum; tapered drain shunt capacitors; Capacitors; Gallium nitride; Impedance; MMICs; Power transmission lines; Transistors; Transmission line measurements; Distributed power amplifier (DPA); GaN; HEMT; MMIC; tapered drain shunt capacitors;
fLanguage :
English
Journal_Title :
Microwave and Wireless Components Letters, IEEE
Publisher :
ieee
ISSN :
1531-1309
Type :
jour
DOI :
10.1109/LMWC.2015.2451351
Filename :
7159068
Link To Document :
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