Title :
Sn–3.0Ag–0.5Cu Nanocomposite Solder Reinforced With Bi2Te3 Nanoparticles
Author :
Si Chen ; Xin Luo ; Di Jiang ; Lilei Ye ; Edwards, Michael ; Liu, Johan
Author_Institution :
Key Lab. of Adv. Display & Syst. Applic., Shanghai Univ., Shanghai, China
Abstract :
Nanocomposite solders are regarded as one of the most promising interconnect materials for the high-density electronic packaging due to their high mechanical strength and fine microstructure. However, the developments of nanocomposite solders have been limited by the inadequate compatibility between nanoparticles and solder matrix with respect to density, hardness, coefficient of thermal expansion, and surface activity. The compatibility issue will lead to a huge loss of nanoparticles from the solder matrix after the reflow soldering process. The thermal fatigue resistance of solder joint will also become degraded. Therefore, aiming to solve this problem, a novel nanocomposite solder consisting of Bi2Te3 semiconductor nanoparticles and Sn-3.0Ag-0.5Cu (SAC305) solder is presented. The effect of nanoparticles on the viscosity of solder paste and the void content of solder bump was first studied. Then, a series of analysis on the composition and microstructure of the solder bump were completed using transmission electron microscopy, X-ray diffraction, inductively coupled plasma-mass spectrometry, scanning electron microscopy, and energy dispersive X-ray spectroscopy. The survival rate of nanoparticles in the solder bump after reflow soldering process reaches as high as 80%. The refined microstructure was observed from the cross section of the nanocomposite solders. The shear test showed that the average mechanical strength of SAC305 solder after the addition of Bi2Te3 nanoparticles was higher. Meanwhile, no thermal fatigue resistance degradation was detected in the nanocomposite solder after 1000 thermal cycles in the range of -40 °C to 115 °C.
Keywords :
X-ray chemical analysis; X-ray diffraction; bismuth compounds; copper alloys; crystal microstructure; electronics packaging; fatigue; mass spectroscopy; mechanical strength; nanocomposites; reflow soldering; scanning electron microscopy; semiconductor materials; silver alloys; solders; thermal expansion; tin alloys; transmission electron microscopy; viscosity; Bi2Te3; SAC305 solder; SnAgCu; X-ray diffraction; energy dispersive X-ray spectroscopy; fine microstructure; high-density electronic packaging; inductively coupled plasma-mass spectrometry; interconnect materials; mechanical strength; nanocomposite solder; reflow soldering process; scanning electron microscopy; semiconductor nanoparticles; shear test; solder bump; solder joint; solder matrix; solder paste; surface activity; temperature -40 degC to 115 degC; thermal expansion coefficient; thermal fatigue resistance; transmission electron microscopy; viscosity; void content; Fatigue; Microstructure; Nanoparticles; Soldering; Thermal resistance; X-ray scattering; Bi₂Te₃ nanoparticles; Bi2Te3 nanoparticles; Nanocomposite solders; Sn-3.0Ag-0.5Cu.; Sn???30Ag???05Cu;
Journal_Title :
Components, Packaging and Manufacturing Technology, IEEE Transactions on
DOI :
10.1109/TCPMT.2015.2446497