DocumentCode
73917
Title
Two-Section Folded-Waveguide Slow-Wave Structure for Terahertz Extended Interaction Oscillator
Author
Wenxin Liu ; Chao Zhao ; Ke Li ; Yong Wang ; Ziqiang Yang
Author_Institution
Inst. of Electron., Beijing, China
Volume
61
Issue
3
fYear
2014
fDate
Mar-14
Firstpage
902
Lastpage
908
Abstract
Extended interaction oscillator (EIO) is a promising terahertz (THz) power source, which has many potential important applications, such as military radar, medical imaging and material science research, and so on. To improve the operation performances of the THz EIO, a novel type of two-section folded waveguide (TSFW) slow wave structure (SWS) is proposed in this paper. The dispersion characteristics for TSFW obtained by an equivalent circuit model are analyzed, and the output characteristics for TSFW EIO are studied and optimized with the help of 3-D particle-in-cell simulation. Comparing with the single section of FW SWS, the remarkable enhancement of output power in the TSFW SWS is observed from 50 up to 130 W. Based on the proposal model, the TSFW is fabricated with a high speed numerical control milling machine and its transmission characteristics are tested. The results of the cold test are in agreement with theoretical predications.
Keywords
dispersion (wave); slow wave structures; submillimetre wave oscillators; terahertz wave devices; waveguide components; 3D particle-in-cell simulation; EIO; SWS; THz power source; TSFW; dispersion characteristics; equivalent circuit model; high speed numerical control milling machine; material science research; medical imaging; military radar; power 50 mW to 130 mW; terahertz extended interaction oscillator; transmission characteristics; two-section folded-waveguide slow-wave structure; Analytical models; Couplings; Dispersion; Electron beams; Impedance; Integrated circuit modeling; Power generation; 3-D particle-in-cell (PIC) simulation; extended interaction oscillator (EIO); terahertz (THz); two-section folded waveguide (TSFW) slow wave structure (SWS);
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/TED.2013.2297343
Filename
6720165
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