DocumentCode :
739472
Title :
Large-Area n-Type PERT Solar Cells Featuring Rear p+ Emitter Passivated by ALD Al2 O3
Author :
Cornagliotti, Emanuele ; Uruena, Angel ; Aleman, Monica ; Sharma, Aashish ; Tous, Loic ; Russell, Richard ; Choulat, Patrick ; Jia Chen ; John, Joachim ; Haslinger, Michael ; Duerinckx, Filip ; Dielissen, Bas ; Gortzen, Roger ; Black, Lachlan ; Szlufcik,
Author_Institution :
Imec, Leuven, Belgium
Volume :
5
Issue :
5
fYear :
2015
Firstpage :
1366
Lastpage :
1372
Abstract :
We present large-area n-type PERT solar cells featuring a rear boron emitter passivated by a stack of ALD Al2O3 and PECVD SiOx. After illustrating the technological and fundamental advantages of such a device architecture, we show that the Al2O3/SiOx stack employed to passivate the boron emitter is unaffected by the rear metallization processes and can suppress the Shockley-Read-Hall surface recombination current to values below 2 fA/cm2, provided that the Al2O3 thickness is larger than 7 nm. Efficiencies of 21.5% on 156-mm commercial-grade Cz-Si substrates are demonstrated in this study, when the rear Al2O3 /SiOx passivation is applied in combination with a homogeneous front-surface field (FSF). The passivation stack developed herein can sustain cell efficiencies in excess of 22% and Voc above 685 mV when a selective FSF is implemented, despite the absence of passivated contacts. Finally, we demonstrate that such cells do not suffer from light-induced degradation.
Keywords :
alumina; atomic layer deposition; metallisation; passivation; plasma CVD; silicon compounds; solar cells; ALD passivation; Al2O3; PECVD; Shockley-Read-Hall surface recombination current; SiOx; device architecture; front surface field; n-type PERT solar cells; rear boron emitter; rear metallization processes; rear p+ emitter; Boron; Computer architecture; Metallization; Microprocessors; Passivation; Surface texture; Atomic layer deposition (ALD) Al2O3; Cu-plating; n-PERT cell;
fLanguage :
English
Journal_Title :
Photovoltaics, IEEE Journal of
Publisher :
ieee
ISSN :
2156-3381
Type :
jour
DOI :
10.1109/JPHOTOV.2015.2458041
Filename :
7174943
Link To Document :
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