DocumentCode :
739875
Title :
Trapped Photoelectrons During Spacecraft Charging in Sunlight
Author :
Lai, Shu T. ; Cahoy, Kerri
Author_Institution :
Space Propulsion Laboratory, Massachusetts Institute of Technology, Cambridge, MA, USA
Volume :
43
Issue :
9
fYear :
2015
Firstpage :
2856
Lastpage :
2860
Abstract :
For a dielectric spacecraft charging in sunlight, the potentials are different on the sunlit and dark sides. Differential charging of spacecraft surfaces can trap low-energy electrons by means of potential wells and barriers. The low-energy electrons are mostly photoelectrons and secondary electrons. Motivated by the recent interest in trapped photoelectrons measured by the Van Allen Probes in the radiation belts, we calculate the extent of the trapped photoelectron area and the potential barrier as a function of the dipole strength and sun angle using the monopole–dipole model. We find that the dipole strength is an important parameter in controlling the behavior of the potential wells and barriers. The usual inequality, 1/2 \\le A \\le 1 where A is the dipole strength, used in the monopole–dipole model can be relaxed and amended for finite sun angles. We then use a simple method to estimate the density of the trapped low-energy electrons in these areas. In sunlight charging, the low-energy electron population around the spacecraft is enhanced by the photoelectrons trapped inside the potential barrier.
Keywords :
Aircraft manufacture; Electric potential; Electron traps; Potential well; Satellites; Space vehicles; Surface charging; Barrier; Van Allen Probes; chorus waves; critical temperature; eclipse passage; electron density; electron temperature; geosynchronous environment; monopole-dipole potential; monopole???dipole potential; photoemission; potential well; radiation belts; saddle point; spacecraft charging; spacecraft charging in sunlight; trapped photoelectron; wave-particle interaction; wave-particle interaction.;
fLanguage :
English
Journal_Title :
Plasma Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0093-3813
Type :
jour
DOI :
10.1109/TPS.2015.2453370
Filename :
7182336
Link To Document :
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