DocumentCode
739960
Title
ITD Double-Edge Diffraction for Complex Source Beam Illumination
Author
Toccafondi, A. ; Canta, S.M. ; Erricolo, Danilo
Author_Institution
Dipt. di Ing. dell´Inf., Univ. di Siena, Siena, Italy
Volume
61
Issue
5
fYear
2013
fDate
5/1/2013 12:00:00 AM
Firstpage
2688
Lastpage
2694
Abstract
A new high-frequency incremental theory of diffraction (ITD) formulation for the double diffraction by metallic wedges when illuminated by complex source points (CSP) is provided. The main motivation is the extension of the class of problems that can be studied using asymptotic (i.e., ray-based and incremental) methods by providing a double diffraction description for CSP, which are considered because they are efficient to analyze electrically large structures. The new formulation provides an accurate asymptotic description of the interaction between two edges in an arbitrary configuration, including slope diffraction contributions. Advantages of the ITD formulation for CSP illumination include avoiding the typical ray-caustic impairments of the GTD/UTD ray techniques and not requiring ray tracing in complex space. Numerical results are presented and compared to a Method-of-Moments analysis to demonstrate the accuracy of the solution.
Keywords
geometrical theory of diffraction; method of moments; ray tracing; CSP; GTD-UTD ray tracing technique; ITD double-edge diffraction; asymptotic description; complex source beam illumination; complex source point; high-frequency incremental theory of diffraction; incremental method; metallic wedge; method-of-moment analysis; ray-based method; ray-caustic impairment; slope diffraction contribution; Accuracy; Feeds; Geometry; Lighting; Moment methods; Scattering; Vectors; Complex source beams (CSB); complex source points (CSP); diffraction; geometrical theory of diffraction; incremental theory of diffraction (ITD); incremental theory of double diffraction; method of moments (MoM);
fLanguage
English
Journal_Title
Antennas and Propagation, IEEE Transactions on
Publisher
ieee
ISSN
0018-926X
Type
jour
DOI
10.1109/TAP.2013.2244553
Filename
6425413
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