• DocumentCode
    740115
  • Title

    Normally-off vertical-type mesa-gate GaN MOSFET

  • Author

    Chul-Ho Won ; Ki-Won Kim ; Dong-Seok Kim ; Hee-Sung Kang ; Ki-Sik Im ; Young-Woo Jo ; Do-Kywn Kim ; Ryun-Hwi Kim ; Jung-Hee Lee

  • Author_Institution
    Sch. of Electron. Eng., Kyungpook Nat. Univ., Daegu, South Korea
  • Volume
    50
  • Issue
    23
  • fYear
    2014
  • Firstpage
    1749
  • Lastpage
    1751
  • Abstract
    A vertical-type mesa-gate GaN metal-oxide semiconductor field-effect transistor (MOSFET) has been fabricated. The mesa-gate structure can be easily achieved by a single deep etch to the n+-GaN which is the drain of the device, whereas the trench-gate structure, the commonly used structure for the vertical-type MOSFETs, requires an additional etching process to define the gate region. The mesa-gate GaN MOSFET exhibited a normally-off operation with the threshold voltage of 3 V, a normalised drain current of ~ 55 mA/mm and a high on/off current ratio of 108.
  • Keywords
    III-V semiconductors; MOSFET; etching; gallium compounds; wide band gap semiconductors; GaN; n+-GaN; normalised drain current; normally-off vertical-type mesa-gate MOSFET; on/off current ratio; single deep etch; threshold voltage; trench-gate structure; vertical-type mesa-gate metal-oxide semiconductor field-effect transistor; voltage 3 V;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el.2014.1692
  • Filename
    6955130