DocumentCode :
740291
Title :
On-chip linear voltage regulator module (VRM) effect on power distribution network (PDN) noise and jitter at high-speed output buffer
Author :
Heegon Kim ; Sukjin Kim ; Joungho Kim ; Changwook Yoon ; Achkir, Brice ; Jun Fan
Author_Institution :
TERA Lab., Korea Adv. Inst. of Sci. & Technol., Daejeon, South Korea
Volume :
4
Issue :
2
fYear :
2015
Firstpage :
108
Lastpage :
113
Abstract :
In this paper, the reduction of power distribution network noise and jitter at high-speed output buffer by using on-chip linear voltage regulator module circuit is introduced and analyzed. The transient response of typical on-chip linear VRM circuit is analyzed in power gating condition. When the on-chip linear VRM circuit is inserted between on-chip PDN and operating high-speed output buffers, the on-chip PDN noise and jitter at output buffer are significantly reduced. The larger on-chip decoupling capacitor leads to the lower PDN noise generated by on-chip linear VRM circuit. The on-chip linear VRM also reduces the impact of the aggressor buffer to the victim buffer in different PDN, resulting in the improved performance of the victim buffer. Reduction of PDN noise and jitter at output buffer using on-chip linear VRM are validated based on SPICE simulation with 110 nm CMOS technology library.
Keywords :
CMOS integrated circuits; buffer circuits; integrated circuit noise; jitter; modules; transient response; voltage regulators; CMOS technology; PDN noise; SPICE simulation; complementary metal oxide semiconductor; high-speed output buffer; jitter; on-chip decoupling capacitor; on-chip linear VRM circuit; on-chip linear voltage regulator module circuit; power distribution network noise; power gating condition; size 110 nm; transient response; Capacitors; Integrated circuit modeling; Power distribution; Switches; System-on-chip; Transistors; Voltage control; PDN noise; jitter; on-chip linear voltage regulator module (VRM); power distribution network (PDN);
fLanguage :
English
Journal_Title :
Electromagnetic Compatibility Magazine, IEEE
Publisher :
ieee
ISSN :
2162-2264
Type :
jour
DOI :
10.1109/MEMC.2015.7204062
Filename :
7204062
Link To Document :
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