Title :
Improvements on Optical and Chromatic Uniformities of Light-Emitting Diodes With Microscale-Roughness-Controlled Surfaces
Author :
Hua Xiao ; Yi-Jun Lu ; Zi-Quan Guo ; Yue Lin ; Tien-Mo Shih ; Zhong Chen
Author_Institution :
Dept. of Electron. Sci., Xiamen Univ., Xiamen, China
Abstract :
In the light-emitting-diode (LED) industry, it is a great challenge to simultaneously achieve high efficiency values and excellent light quality in practical applications. In this paper, we have designed microscale-roughness-controlled-surface modules to optimize rectified mellowness index, quantum efficiency, correlated color temperature, and color rendering index; we have also discovered a mechanism that reduces the total internal reflection trapped within the diffuser, maximizes phosphor fluorescence probabilities, and randomizes photon emissions. The first effect subsequently leads to the photon-propagation-direction rectification, such that incident photons are allowed to escape from the top but are discouraged to reversely exit from the bottom. In addition to the discovery of this mechanism, we have proposed a previously undefined criterion that evaluates the uniformity of various optical parameters exemplified by wavelengths, solid angles, and spatial distributions. Current findings offer a guide on future research for human-eye-comfort-related uniformities.
Keywords :
colour; fluorescence; light emitting diodes; phosphors; surface roughness; chromatic uniformities; color rendering index; correlated color temperature; light-emitting diodes; microscale-roughness-controlled surfaces; optical uniformities; phosphor fluorescence probabil- ities; photon emissions; photon-propagation-direction rectification; quantum efficiency; rectified mellowness index; total internal reflection; Color; Indexes; Light emitting diodes; Optical surface waves; Phosphors; Photonics; Solids; Light-emitting diodes (LEDs); phosphor; roughness; total internal reflection;
Journal_Title :
Photonics Journal, IEEE
DOI :
10.1109/JPHOT.2015.2464102