Title :
A Fully On-Chip PT-Invariant Transconductor
Author :
Amaravati, Anvesha ; Dave, Marshnil ; Baghini, Maryam Shojaei ; Sharma, Dinesh K.
Author_Institution :
Dept. of Electr. Eng., IIT Bombay, Mumbai, India
Abstract :
This brief presents a novel process and temperature (PT)-invariant transconductor, fabricated and tested in 180-nm CMOS technology. It uses a novel bias circuit for implementing a PT-invariant transconductor using a MOSFET in triode region. Measurements show that the transconductance varies only by ±3.4% across 18 fabricated chips and over temperatures ranging from 25 °C to 100 °C. Simulations show that variation of the transconductance across process corners is ±6.7% and across temperature range of 0 °C to 100 °C is ±1.6%. The proposed PT-invariant transconductor has the minimum variation among the fully on-chip transconductors reported so far. The proposed circuit consumes 136 μW of power.
Keywords :
CMOS integrated circuits; MOSFET; triodes; CMOS technology; MOSFET; bias circuit; fully on-chip PT-invariant transconductor; power 136 muW; size 180 nm; temperature 0 degC to 100 degC; triode region; Generators; MOSFET; Resistors; Semiconductor device measurement; System-on-chip; Temperature measurement; Transconductance; Process variations; proportional to absolute temperature (PTAT); transconductance;
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
DOI :
10.1109/TVLSI.2014.2347346