• DocumentCode
    741065
  • Title

    Modeling and Dynamic Behavior of Battery Energy Storage: A Simple Model for Large-Scale Time-Domain Stability Studies

  • Author

    Pourbeik, Pouyan ; Williams, Stephen E. ; Weber, James ; Sanchez-Gasca, Juan ; Senthil, Jay ; Shengli Huang ; Bolton, Kent

  • Author_Institution
    Electr. Power Res. Inst., Irving, TX, USA
  • Volume
    3
  • Issue
    3
  • fYear
    2015
  • Firstpage
    47
  • Lastpage
    51
  • Abstract
    With the continued development and proliferation of renewable energy systems worldwide, particularly wind and photovoltaic (PV) generation, computer simulation models for these technologies to be used in large interconnected power-system stability analyses have been a key focus over the past several years. Such computer simulation models are used by power-system planners and operators to simulate various scenarios of large interconnected systems? e.g., continental Europe and the western or eastern North American grid? to assess the stability and reliability of the bulk electric power system. In Europe, much of this work has been led by efforts within the International Electrotechnical Commission, while in North America, most of the major efforts in modeling has gone through the Renewable Energy Modeling Task Force (REMTF) of the Western Electricity Coordinating Council (WECC). The total nameplate capacity of wind generation installed worldwide has surpassed 360,000 MW, and PV generation has surpassed 130,000 MW, with the top three countries in terms of cumulative total capacity being China, the United States, and Germany.
  • Keywords
    battery storage plants; photovoltaic power systems; wind power plants; International Electrotechnical Commission; North America; PV generation; REMTF; Renewable Energy Modeling Task Force; WECC; Western Electricity Coordinating Council; battery energy storage; large-scale time-domain stability; wind generation; Batteries; Computational modeling; Energy storage; Power system stability; Renewable energy sources; Stability analysis; System-on-chip;
  • fLanguage
    English
  • Journal_Title
    Electrification Magazine, IEEE
  • Publisher
    ieee
  • ISSN
    2325-5897
  • Type

    jour

  • DOI
    10.1109/MELE.2015.2447974
  • Filename
    7229444