DocumentCode :
741855
Title :
Soft-Error-Tolerant Design Methodology for Balancing Performance, Power, and Reliability
Author :
Hsuan-Ming Chou ; Ming-Yi Hsiao ; Yi-Chiao Chen ; Keng-Hao Yang ; Jean Tsao ; Chiao-Ling Lung ; Shih-Chieh Chang ; Wen-Ben Jone ; Tien-Fu Chen
Author_Institution :
Dept. of Comput. Sci., Nat. Tsing Hua Univ., Hsinchu, Taiwan
Volume :
23
Issue :
9
fYear :
2015
Firstpage :
1628
Lastpage :
1639
Abstract :
Soft error has become an important reliability issue in advanced technologies. To tolerate soft errors, solutions suggested in previous works incur significant performance and power penalties, especially when a design with fault-tolerant structures is overprotected. In this paper, we present a soft-error-tolerant design methodology to tradeoff performance, power, and reliability for different applications. First, four novel detection and correction flip-flop (FF) structures are proposed to provide different levels of tolerance capability against soft errors. Second, architecture-level vulnerability and logic-level susceptibility analyses are employed to identify weak FFs that can easily cause program execution errors. Third, an optimization framework is developed to synthesize the proposed four novel FF structures into weak and highly observable storage bits with the flexibility of trading off performance, power, and reliability. A five-stage pipeline RISC core (UniRISC) is adopted to demonstrate the usefulness of our methodology. Experimental results show that the proposed method can accomplish design goals by balancing performance, power, and reliability. For example, we can not only satisfy the reliability requirement that no more than five errors occur per one billion hours in a design but also reduce up to 87% performance overhead and 91% power overhead when compared with previous works.
Keywords :
error correction; error detection; fault tolerance; flip-flops; integrated circuit reliability; logic design; radiation hardening (electronics); reduced instruction set computing; architecture level vulnerability; balancing performance; circuit reliability; correction flip-flop structure; five stage pipeline RISC core; logic level susceptibility; power penalties; soft error tolerant design; Clocks; Delays; Estimation; Integrated circuit reliability; Latches; Reliability engineering; Power consumption; reliability; soft error; susceptibility; vulnerability;
fLanguage :
English
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
1063-8210
Type :
jour
DOI :
10.1109/TVLSI.2014.2348872
Filename :
6891393
Link To Document :
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