DocumentCode :
742210
Title :
Equivalent Circuit Modeling of PEM Fuel Cell Degradation Combined With a LFRC
Author :
Jonghoon Kim ; Jaemoon Lee ; Cho, B.H.
Author_Institution :
Energy Storage Syst. Dev. Group, Samsung SDI, Cheonan, South Korea
Volume :
60
Issue :
11
fYear :
2013
Firstpage :
5086
Lastpage :
5094
Abstract :
This approach investigates with an equivalent circuit modeling a polymer electrolyte membrane (PEM) fuel cell degradation combined with a low-frequency ripple current (LFRC) that may shorten the fuel cell life and worsen the fuel efficiency. Through the immediate measurement of the impedance curves on single cells obtained after cycling for hours and operating in cathode flooding and membrane dehydration modes at variable frequencies, it has been shown that the impedance magnitude of a fuel cell injecting a LFRC increased when compared with that of a high-frequency ripple current. This study develops these investigations one step further by designing equivalent circuit elements like resistance and capacitance by electrochemical impedance spectroscopy. Impedance-based model is able to describe the dynamic behavior of the PEM fuel cell. For validation of the proposed fuel cell model, an experimental study has been carried out for a 1.2-kW Nexa module.
Keywords :
cathodes; electrochemical impedance spectroscopy; proton exchange membrane fuel cells; LFRC; PEM fuel cell degradation; cathode flooding; electrochemical impedance spectroscopy; equivalent circuit modeling; impedance curves; low-frequency ripple current; membrane dehydration modes; polymer electrolyte membrane fuel cell degradation; Atmospheric modeling; Cathodes; Degradation; Equivalent circuits; Fuel cells; Integrated circuit modeling; Mathematical model; Degradation; equivalent circuit modeling; polymer electrolyte membrane (PEM) fuel cell; ripple current;
fLanguage :
English
Journal_Title :
Industrial Electronics, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0046
Type :
jour
DOI :
10.1109/TIE.2012.2226414
Filename :
6339052
Link To Document :
بازگشت