• DocumentCode
    742376
  • Title

    Distance-Based Image Classification: Generalizing to New Classes at Near-Zero Cost

  • Author

    Mensink, Thomas ; Verbeek, Jakob ; Perronnin, Florent ; Csurka, Gabriela

  • Author_Institution
    ISLA Lab., Univ. of Amsterdam, Amsterdam, Netherlands
  • Volume
    35
  • Issue
    11
  • fYear
    2013
  • Firstpage
    2624
  • Lastpage
    2637
  • Abstract
    We study large-scale image classification methods that can incorporate new classes and training images continuously over time at negligible cost. To this end, we consider two distance-based classifiers, the k-nearest neighbor (k-NN) and nearest class mean (NCM) classifiers, and introduce a new metric learning approach for the latter. We also introduce an extension of the NCM classifier to allow for richer class representations. Experiments on the ImageNet 2010 challenge dataset, which contains over 106 training images of 1,000 classes, show that, surprisingly, the NCM classifier compares favorably to the more flexible k-NN classifier. Moreover, the NCM performance is comparable to that of linear SVMs which obtain current state-of-the-art performance. Experimentally, we study the generalization performance to classes that were not used to learn the metrics. Using a metric learned on 1,000 classes, we show results for the ImageNet-10K dataset which contains 10,000 classes, and obtain performance that is competitive with the current state-of-the-art while being orders of magnitude faster. Furthermore, we show how a zero-shot class prior based on the ImageNet hierarchy can improve performance when few training images are available.
  • Keywords
    image classification; learning (artificial intelligence); support vector machines; ImageNet 2010 challenge dataset; ImageNet hierarchy; ImageNet-10K dataset; NCM classifiers; NCM performance; current state-of-the-art performance; distance-based classifiers; distance-based image classification; k-NN; k-nearest neighbor; large-scale image classification methods; linear SVM; metric learning approach; near-zero cost; nearest class mean classifiers; negligible cost; richer class representations; training images; zero-shot class prior; Covariance matrices; Image classification; Image retrieval; Measurement; Support vector machine classification; Training; Training data; Metric learning; image retrieval; k-nearest neighbors classification; large scale image classification; nearest class mean classification; transfer learning; zero-shot learning; Algorithms; Artificial Intelligence; Computer Simulation; Image Enhancement; Image Interpretation, Computer-Assisted; Models, Theoretical; Pattern Recognition, Automated;
  • fLanguage
    English
  • Journal_Title
    Pattern Analysis and Machine Intelligence, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0162-8828
  • Type

    jour

  • DOI
    10.1109/TPAMI.2013.83
  • Filename
    6517188