DocumentCode :
742431
Title :
Skin-Effect Loss Models for Time- and Frequency-Domain PEEC Solver
Author :
Ruehli, Albert E. ; Antonini, Giulio ; Li Jun Jiang
Author_Institution :
EMC Lab., Missouri Univ. of Sci. & Technol., Rolla, MO, USA
Volume :
101
Issue :
2
fYear :
2013
Firstpage :
451
Lastpage :
472
Abstract :
A challenging and interesting issue for the solution of large electromagnetic problems is the efficient, sufficiently accurate modeling of the broadband skin-effect loss for conducting planes and 3-D shapes. The inclusion of such models in an electromagnetic (EM) solver can be very costly in compute time and memory requirements. These issues are particularly important for the class of signal, power, and noise integrity (NI) problems. In this paper, we concentrate on partial element equivalent circuit (PEEC)-type methods which are suitable for the solution of this class of problems. Progress has been made recently in the design of skin-effect models. The difficult issues are broadband frequency-domain or time-domain problems. These models are considered in this paper. We present several solution methods, and we compare results obtained with these approaches.
Keywords :
computational electromagnetics; conducting materials; equivalent circuits; frequency-domain analysis; losses; skin effect; time-domain analysis; 3D shapes; broadband skin-effect loss; conducting planes; electromagnetic solver; frequency-domain PEEC solver; large electromagnetic problems; partial element equivalent circuit type methods; skin effect loss models; time-domain PEEC solver; Computational modeling; Conductors; Integral equations; Integrated circuit modeling; Mathematical model; Solid modeling; Surface impedance; Modified nodal analysis (MNA); noise integrity (NI); partial element equivalent circuit (PEEC); power integrity (PI); signal integrity (SI); transmission line (TL);
fLanguage :
English
Journal_Title :
Proceedings of the IEEE
Publisher :
ieee
ISSN :
0018-9219
Type :
jour
DOI :
10.1109/JPROC.2012.2220312
Filename :
6353491
Link To Document :
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