DocumentCode :
742499
Title :
An On-Die All-Digital Power Supply Noise Analyzer With Enhanced Spectrum Measurements
Author :
Tzu-Chien Hsueh ; O´Mahony, Frank ; Mansuri, Mozhgan ; Casper, Bryan
Author_Institution :
Intel Corp., Hillsboro, OR, USA
Volume :
50
Issue :
7
fYear :
2015
fDate :
7/1/2015 12:00:00 AM
Firstpage :
1711
Lastpage :
1721
Abstract :
A scalable all-digital power supply noise analyzer with 20 GHz sampling bandwidth and 1 mV resolution is demonstrated in 32 nm CMOS technology for enabling low-cost low-power in-situ power supply noise measurements without dedicated clean supplies and clock sources. This subsampled averaging-based analyzer measures power supply noise in both the equivalent-time and frequency domains with low-resolution VCO-based ADCs. For equivalent-time measurements, the accurate impedance characterization of power delivery networks is simply done by measuring a clock-synchronized current-step response. For frequency-domain measurements, the digital random phase-noise accumulation technique is analyzed and verified to overcome the clock-and-noise correlation issue in autocorrelation measurements. In general large scale integrated circuits and systems, the entire power supply noise analyzer consumes negligible active and leakage powers because of the MHz-range sampling clock frequency and fully digital implementation with only hundreds of logic gates.
Keywords :
CMOS integrated circuits; analogue-digital conversion; frequency-domain analysis; integrated circuit noise; low-power electronics; noise measurement; phase noise; power supply circuits; spectral analysers; synchronisation; time-domain analysis; voltage-controlled oscillators; CMOS technology; MHz-range sampling clock frequency; active powers; autocorrelation measurements; bandwidth 20 GHz; clock-and-noise correlation; clock-synchronized current-step response; digital random phase-noise accumulation technique; enhanced spectrum measurements; equivalent-time domains; equivalent-time measurements; frequency-domain measurements; general large scale integrated circuits; impedance characterization; leakage powers; logic gates; low-cost low-power in-situ power supply noise measurements; low-resolution VCO-based ADCs; on-die all-digital power supply noise analyzer; power delivery networks; size 32 nm; subsampled averaging-based analyzer; voltage 1 mV; Clocks; Correlation; Frequency measurement; Noise; Noise measurement; Power measurement; Synchronization; Autocorrelation Function; equivalent time measurement; glitch free; impedance measurement; phase noise accumulation; power delivery; spectrum measurement; supply noise measurement;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.2015.2431071
Filename :
7109950
Link To Document :
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