• DocumentCode
    742583
  • Title

    Measurements of Endurance Time for Electrostatic Discharge of Spacecraft Materials: A Defect-Driven Dynamic Model

  • Author

    Andersen, Allen ; Dennison, John Robert ; Sim, Alec M. ; Sim, Charles

  • Author_Institution
    Department of PhysicsMaterials Physics Group, Utah State University, Logan, UT, USA
  • Volume
    43
  • Issue
    9
  • fYear
    2015
  • Firstpage
    2941
  • Lastpage
    2953
  • Abstract
    Electrostatic breakdown leads to the majority of anomalies and failures attributed to spacecraft interactions with the plasma space environment. It is therefore critical to understand how the electrostatic field strength ( F_{{ESD}} ) of spacecraft materials varies due to environmental conditions, such as duration of applied electric field, rate of field change, history of exposure to high fields, and temperature. We have developed a dual-defect, thermodynamic, mean-field trapping model in terms of recoverable and irrecoverable defect modes to predict probabilities of breakdown. Fits to a variety of measurements of the dependence of F_{ {ESD}} of insulating polymers on endurance time, voltage ramp rate, and temperature based on this model yield consistent results. Our experimental results for the prototypical materials, low-density polyethylene and polymer (PI or Kapton HN), suggest that the values of F_{ {ESD}} from standard handbooks, or cursory measurements that have been used routinely in the past, substantially overestimate the field required for breakdown in common spacecraft applications, which often apply subcritical fields for very long time periods as charge accumulates.
  • Keywords
    Electrostatic discharges; Electrostatic measurements; Electrostatics; Temperature measurement; Time measurement; Voltage measurement; Arcing; breakdown; electrostatic discharge (ESD); polymers; space environment effects; spacecraft charging; spacecraft charging.;
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/TPS.2015.2428258
  • Filename
    7110395