• DocumentCode
    743204
  • Title

    Overview of Beyond-CMOS Devices and a Uniform Methodology for Their Benchmarking

  • Author

    Esch, J.

  • Volume
    101
  • Issue
    12
  • fYear
    2013
  • Firstpage
    2495
  • Lastpage
    2497
  • Abstract
    Presents a prolog to the article, "Overview of Beyond-CMOS Devices and a Uniform Methodology for Their Benchmarking".
  • Keywords
    CMOS integrated circuits; integrated circuit testing; semiconductor technology; technological forecasting; CMOS devices; device benchmarking; uniform methodology; Adders; Benchmark testing; CMOS technology; Integrated circuits; Nanoelectronics; Power dissipation; Semiconductor devices; Special issues and sections; Throughput;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IEEE
  • Publisher
    ieee
  • ISSN
    0018-9219
  • Type

    jour

  • DOI
    10.1109/JPROC.2013.2286655
  • Filename
    6658291
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=743204