DocumentCode :
74359
Title :
Copper Waveguide Cavities With Reduced Surface Loss for Coupling to Superconducting Qubits
Author :
Bogorin, Daniela F. ; McClure, Doug T. ; Ware, Matthew ; Plourde, B.L.T.
Author_Institution :
Dept. of Phys., Syracuse Univ., Syracuse, NY, USA
Volume :
24
Issue :
4
fYear :
2014
fDate :
Aug. 2014
Firstpage :
1
Lastpage :
7
Abstract :
Significant improvements in superconducting qubit coherence times have been achieved recently with 3-D microwave waveguide cavities coupled to transmon qubits. While many of the measurements in this direction have utilized superconducting aluminum cavities, other recent work has involved qubits coupled to copper cavities with coherence times approaching 0.1 ms. The copper provides a good path for thermalizing the cavity walls and qubit chip, although the substantial cavity loss makes conventional dispersive qubit measurements challenging. We are exploring various approaches for improving the quality factor of 3-D copper cavities, including electropolishing and coating with superconducting layers of tin. We have characterized these cavities on multiple cooldowns and found tin plating to be robust. In addition, we have performed coherence measurements on transmon qubits in these cavities and observed promising performance.
Keywords :
copper; electrolytic polishing; superconducting materials; superconducting transition temperature; tin; voids (solid); waveguides; 3D microwave waveguide cavities; Cu; Sn; coating; conventional dispersive qubit measurements; copper waveguide cavities; electropolishing; superconducting aluminum cavities; superconducting qubit coherence times; superconducting tin layers; superconducting transition temperature; surface loss reduction; transmon qubits; Cavity resonators; Coherence; Copper; Q-factor; Semiconductor device measurement; Superconducting microwave devices; Temperature measurement; 3-D cavity resonators; Cavity quality factor; cQED; superconducting qubits; transmon;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/TASC.2014.2330522
Filename :
6846295
Link To Document :
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