DocumentCode
74359
Title
Copper Waveguide Cavities With Reduced Surface Loss for Coupling to Superconducting Qubits
Author
Bogorin, Daniela F. ; McClure, Doug T. ; Ware, Matthew ; Plourde, B.L.T.
Author_Institution
Dept. of Phys., Syracuse Univ., Syracuse, NY, USA
Volume
24
Issue
4
fYear
2014
fDate
Aug. 2014
Firstpage
1
Lastpage
7
Abstract
Significant improvements in superconducting qubit coherence times have been achieved recently with 3-D microwave waveguide cavities coupled to transmon qubits. While many of the measurements in this direction have utilized superconducting aluminum cavities, other recent work has involved qubits coupled to copper cavities with coherence times approaching 0.1 ms. The copper provides a good path for thermalizing the cavity walls and qubit chip, although the substantial cavity loss makes conventional dispersive qubit measurements challenging. We are exploring various approaches for improving the quality factor of 3-D copper cavities, including electropolishing and coating with superconducting layers of tin. We have characterized these cavities on multiple cooldowns and found tin plating to be robust. In addition, we have performed coherence measurements on transmon qubits in these cavities and observed promising performance.
Keywords
copper; electrolytic polishing; superconducting materials; superconducting transition temperature; tin; voids (solid); waveguides; 3D microwave waveguide cavities; Cu; Sn; coating; conventional dispersive qubit measurements; copper waveguide cavities; electropolishing; superconducting aluminum cavities; superconducting qubit coherence times; superconducting tin layers; superconducting transition temperature; surface loss reduction; transmon qubits; Cavity resonators; Coherence; Copper; Q-factor; Semiconductor device measurement; Superconducting microwave devices; Temperature measurement; 3-D cavity resonators; Cavity quality factor; cQED; superconducting qubits; transmon;
fLanguage
English
Journal_Title
Applied Superconductivity, IEEE Transactions on
Publisher
ieee
ISSN
1051-8223
Type
jour
DOI
10.1109/TASC.2014.2330522
Filename
6846295
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