• DocumentCode
    743655
  • Title

    Flaw detection and measurement for mobile display

  • Author

    Yao-Chin Wang ; Bor-Shyh Lin

  • Author_Institution
    Inst. of Photonic Syst., Nat. Chiao Tung Univ., Tainan, Taiwan
  • Volume
    8
  • Issue
    6
  • fYear
    2014
  • Firstpage
    546
  • Lastpage
    551
  • Abstract
    With advanced small-pixel and high-resolution mobile displays, the display are obtaining smaller pixel size and higher resolution on thin-film-transistor (TFT) array process. This study proposed the flaw detection and measurement in small pixel design mobile displays based on oxide-semiconductor-based TFT liquid crystal displays. The measurement is with respect to electrical-physic characterisation metrics and observer studies. Studies resulted in small-sized pixel TFT array between the flaw detection performance and maker preference approaches. Detection performance factors provided information on the differences among small pixel design for advanced mobile display technologies. The results of the detection performance and preference study showed that the application for advanced mobile display panels. It also shown that critical pixel defect played an important role than previously seen in non-small pixel TFT array panels for managing process yield. The method of voltage imaging for detection, developed in this study provides an initial insight into the high resolution of small-sized pixel designs for advanced mobile displays with precision and diagnostic images in portable devices.
  • Keywords
    computer displays; flat panel displays; flaw detection; liquid crystal displays; portable instruments; thin film transistors; critical pixel defect; electrical-physic characterisation metrics; flaw detection performance; flaw measurement; oxide semiconductor-based TFT liquid crystal display; pixel design mobile display panel; portable devices; small-sized pixel TFT array; thin film transistor array process; voltage imaging;
  • fLanguage
    English
  • Journal_Title
    Science, Measurement & Technology, IET
  • Publisher
    iet
  • ISSN
    1751-8822
  • Type

    jour

  • DOI
    10.1049/iet-smt.2013.0190
  • Filename
    6985838