Title :
Tolerant Control for Power Transistor Faults in Switched Reluctance Motor Drives
Author :
Hak-Seung Ro ; Dong-Hee Kim ; Hae-Gwang Jeong ; Kyo-Beum Lee
Author_Institution :
Dept. of Electr. & Comput. Eng., Ajou Univ., Suwon, South Korea
Abstract :
This paper presents a fault identification and tolerant method for switched reluctance motor (SRM) drives. The reliability of a power transistor in a power converter is the source of most problems in several industrial applications. It is critical to correctly diagnosis the faults occurring in a drive system to avoid harmful accidents and to ensure continuity of operation. In this paper, two types of faults, namely, short- and open-circuit faults, are analyzed on the basis of the current patterns of the power transistors of SRM drives. A fault is detected when the measured amplitude of the current differs from that of the normal-state current. A fault-tolerant scheme is applied according to the type of fault. Simulations and experiments are performed on a 1.0-kW SRM drive. The results are presented to verify the validity of the proposed method.
Keywords :
fault diagnosis; fault tolerant control; machine control; power convertors; power transistors; reluctance motor drives; semiconductor device reliability; SRM drives; fault diagnosis; fault identification method; fault-tolerant scheme; power 1.0 kW; power converter; power transistor faults; power transistor reliability; switched reluctance motor drives; tolerant control; Circuit faults; Fault tolerance; Fault tolerant systems; Power transistors; Switches; Switching circuits; Torque; Open-switch fault; Switched reluctance motor drive; open-switch fault; open-switch fault detection; open-switch fault-tolerant scheme; openswitch fault tolerant scheme; short-switch fault; short-switch fault detection; short-switch fault-tolerant scheme; shortswitch fault tolerant scheme; switched reluctance motor (SRM) drive;
Journal_Title :
Industry Applications, IEEE Transactions on
DOI :
10.1109/TIA.2015.2411662