• DocumentCode
    743981
  • Title

    High-Current ESD Test of Advanced Triple Junction Solar Array Coupon

  • Author

    Wright, Kenneth H. ; Schneider, Todd A. ; Vaughn, Jason A. ; Hoang, Bao ; Wong, Frankie K.

  • Author_Institution
    Center for Space Plasma and Aeronomic Research, The University of Alabama in Huntsville, Huntsville, AL, USA
  • Volume
    43
  • Issue
    9
  • fYear
    2015
  • Firstpage
    2993
  • Lastpage
    2999
  • Abstract
    Testing was conducted on an advanced triple junction (ATJ) coupon that was part of a risk reduction effort in the development of a high-powered solar array design by Space Systems/Loral, LLC (SSL). The ATJ coupon was a small, four-cell, two-string configuration that has served as the basic test coupon design used in previous SSL environmental aging campaigns. The coupon has many attributes of the flight design; e.g., substrate structure with graphite face sheets, integrated by-pass diodes, cell interconnects, room-temperature vulcanizing grout, and wire routing. The objective of this test was to evaluate the performance of the coupon after it is subjected to secondary arc testing at two string voltages (100 and 150 V) and four array currents (1.650, 2.000, 2.475, and 3.300 A). An external test circuit, unique to SSL solar array design, was built that simulates the effect of missing cells and strings in a full solar panel with special primary arc (PA) flashover circuitry. A total of 73 PAs were obtained that included seven temporary sustained arcs (TSAs) events. The durations of the TSAs ranged from 50~\\mu text{s} to 2.75 ms. All TSAs occurred at a string voltage of 150 V. Post-test large area pulsed solar simulator, Dark I V , and by-pass diode tests showed that no degradation occurred due to the TSA events. In addition, the post-test insulation resistance measured was >50~text{G}\\Omega between cells and substrate. These test results point toward a robust design for application to a high-current, high-power mission.
  • Keywords
    Arrays; Electron beams; Electrostatic discharges; Probes; Substrates; Testing; Voltage measurement; Electrostatic discharge (ESD) testing; high-power solar array; photovoltaic cell testing; photovoltaic cell testing.;
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/TPS.2015.2440185
  • Filename
    7124509