Title :
III–V Oxidation: Discoveries and Applications in Vertical-Cavity Surface-Emitting Lasers
Author :
Dallesasse, J.M. ; Deppe, Dennis G.
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
Abstract :
Since the discovery of III-V oxidation by Dallesasse and Holonyak in 1989, significant progress has been made, both technically and commercially, on the use of oxides in compound semiconductor devices. The process-induced modification of refractive index and conductivity allows control of the two carriers of information in optoelectronic systems, the photon and the electron, enabling wide-ranging device applications. Of great technical and commercial importance has been the use of oxidation for the fabrication of high-speed vertical-cavity surface-emitting lasers (VCSELs), first implemented by Deppe´s group at The University of Texas at Austin (Austin, TX, USA). Here, the low refractive index III-V oxide´s interaction with the optical modes inside the VCSEL creates an optimal overlap of gain and field, enabling lasers with ultralow threshold currents and desirable optical beam properties. The discovery of III-V oxidation, key technical milestones in the fabrication of photonic and electronic devices that use oxidation, and the application to VCSELs are reviewed.
Keywords :
III-V semiconductors; laser beams; laser cavity resonators; laser modes; oxidation; refractive index; semiconductor lasers; surface emitting lasers; III-V oxidation; VCSEL; electronic devices; high-speed vertical-cavity surface-emitting lasers; laser gain; low refractive index III-V oxide; optical beam properties; optical modes; photonic devices; ultralow threshold currents; Laser applications; Light emitting diodes; Optical device fabrication; Optical fiber networks; Optical refraction; Oxidation; Quantum well devices; Semiconductor lasers; Vertical cavity surface emitting lasers; III–V semiconductor materials; metal–oxide–semiconductor (MOS) devices; metal–oxide–semiconductor field-effect transistors (MOSFETs); optical device fabrication; optical fiber devices; optical fiber networks; optical interconnections; optical transmitters; quantum-well (QW) lasers; semiconductor devices; semiconductor lasers; surface-emitting lasers (SELs); vertical-cavity surface-emitting lasers (VCSELs);
Journal_Title :
Proceedings of the IEEE
DOI :
10.1109/JPROC.2013.2274931