• DocumentCode
    744250
  • Title

    Variability Effects in Graphene: Challenges and Opportunities for Device Engineering and Applications

  • Author

    Guangyu Xu ; Yuegang Zhang ; Xiangfeng Duan ; Balandin, A.A. ; Wang, K.L.

  • Author_Institution
    Sch. of Eng. & Appl. Sci., Harvard Univ., Cambridge, MA, USA
  • Volume
    101
  • Issue
    7
  • fYear
    2013
  • fDate
    7/1/2013 12:00:00 AM
  • Firstpage
    1670
  • Lastpage
    1688
  • Abstract
    Variability effects in graphene can result from the surrounding environment and the graphene material itself, which form a critical issue in examining the feasibility of graphene devices for large-scale production. From the reliability and yield perspective, these variabilities cause fluctuations in the device performance, which should be minimized via device engineering. From the metrology perspective, however, the variability effects can function as novel probing mechanisms, in which the “signal fluctuations” can be useful for potential sensing applications. This paper presents an overview of the variability effects in graphene, with emphasis on their challenges and opportunities for device engineering and applications. The discussion can extend to other thin-film, nanowire, and nanotube devices with similar variability issues, forming general interest in evaluating the promise of emerging technologies.
  • Keywords
    graphene; reliability; device engineering; device performance fluctuations; graphene devices; graphene material; large-scale production; metrology perspective; nanotube devices; nanowire devices; potential sensing applications; probing mechanisms; reliability perspective; signal fluctuations; thin-film devices; variability effects; yield perspective; Fluctuations; Graphene; Logic gates; Metrology; Nanoscale devices; Noise measurement; Device engineering; device scalability; edge disorder; graphene; interface traps; low-frequency noise; metrology; sensing applications; variability effects;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IEEE
  • Publisher
    ieee
  • ISSN
    0018-9219
  • Type

    jour

  • DOI
    10.1109/JPROC.2013.2247971
  • Filename
    6487371