DocumentCode :
744250
Title :
Variability Effects in Graphene: Challenges and Opportunities for Device Engineering and Applications
Author :
Guangyu Xu ; Yuegang Zhang ; Xiangfeng Duan ; Balandin, A.A. ; Wang, K.L.
Author_Institution :
Sch. of Eng. & Appl. Sci., Harvard Univ., Cambridge, MA, USA
Volume :
101
Issue :
7
fYear :
2013
fDate :
7/1/2013 12:00:00 AM
Firstpage :
1670
Lastpage :
1688
Abstract :
Variability effects in graphene can result from the surrounding environment and the graphene material itself, which form a critical issue in examining the feasibility of graphene devices for large-scale production. From the reliability and yield perspective, these variabilities cause fluctuations in the device performance, which should be minimized via device engineering. From the metrology perspective, however, the variability effects can function as novel probing mechanisms, in which the “signal fluctuations” can be useful for potential sensing applications. This paper presents an overview of the variability effects in graphene, with emphasis on their challenges and opportunities for device engineering and applications. The discussion can extend to other thin-film, nanowire, and nanotube devices with similar variability issues, forming general interest in evaluating the promise of emerging technologies.
Keywords :
graphene; reliability; device engineering; device performance fluctuations; graphene devices; graphene material; large-scale production; metrology perspective; nanotube devices; nanowire devices; potential sensing applications; probing mechanisms; reliability perspective; signal fluctuations; thin-film devices; variability effects; yield perspective; Fluctuations; Graphene; Logic gates; Metrology; Nanoscale devices; Noise measurement; Device engineering; device scalability; edge disorder; graphene; interface traps; low-frequency noise; metrology; sensing applications; variability effects;
fLanguage :
English
Journal_Title :
Proceedings of the IEEE
Publisher :
ieee
ISSN :
0018-9219
Type :
jour
DOI :
10.1109/JPROC.2013.2247971
Filename :
6487371
Link To Document :
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