Title :
A Low-Power Highly Sensitive Capacitive Accelerometer IC Using Auto-Zero Time-Multiplexed Differential Technique
Author :
Yan Mei Wang ; Pak Kwong Chan ; Li, Holden King Ho ; Soon-Eng Ong
Author_Institution :
Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore, Singapore
Abstract :
This paper presents a low-power highly sensitive switched-capacitor (SC) readout integrated circuit (IC) for a capacitive accelerometer. Fabricated using bulk micromachining technique, the mechanical sensor with a cantilever structure achieves a high sensitivity and low noise feature. An autozero time-multiplexed differential capacitance-to-voltage converter (AZTMD-CVC) is proposed in the SC readout interface. The CVC is based on a simple single-ended topology to yield a time-multiplexed differential output. As such, dc offset, 1/f noise, thermal drift, and component mismatch errors are significantly reduced in form of common mode errors through the time-multiplexed differential operation. In addition, the thermal noise of the AZTMD-CVC is analyzed and optimized with power so as to achieve good noise-power efficiency. The application specified IC chip is fabricated using 0.35-μm CMOS technology and draws a total current of 240 μA at a ±2.5 V supply. The accelerometer system´s sensitivity is 1.95 V/g. The measured system noise floor is only 1.16 μg/√Hz at 250 Hz and the output noise-power product figure of merit (FOM) is 0.28 (μg/√Hz) x mA.
Keywords :
1/f noise; CMOS integrated circuits; accelerometers; cantilevers; capacitive sensors; low-power electronics; micromachining; microsensors; readout electronics; switched capacitor networks; 1/f noise; CMOS technology; SC readout interface; autozero time-multiplexed differential capacitance-to-voltage converter; bulk micromachining technique; cantilever structure; capacitive accelerometer; component mismatch errors; dc offset; low-power highly sensitive switched-capacitor readout integrated circuit; measured system noise; mechanical sensor; output noise-power product figure of merit; thermal drift; time-multiplexed differential output; Accelerometers; Capacitance; Capacitive sensors; Clocks; Electrodes; Noise; Capacitive accelerometer; bulk micro-machining; micro-electromechanical systems (MEMS); switched-capacitor capacitance-to-voltage converter;
Journal_Title :
Sensors Journal, IEEE
DOI :
10.1109/JSEN.2015.2448600