Title :
Concurrent error detection in current-mode A/D convertors
Author_Institution :
Dept. of Electr. Eng., Michigan State Univ., East Lansing, MI, USA
Abstract :
To achieve validation of correctness of the data converted from A/D convertors, a concurrent error detection (CED) scheme using time redundancy technique is applied to switched-capacitor based current-mode A/D convertor. The proposed design is capable of detecting all transient faults and most permanent faults that occur in switches.
Keywords :
analogue-digital conversion; error detection; fault location; redundancy; switched capacitor networks; A/D convertors; ADC; concurrent error detection; current-mode; permanent faults; switched-capacitor; time redundancy technique; transient faults;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19911468
