• DocumentCode
    744780
  • Title

    Concurrent error detection in current-mode A/D convertors

  • Author

    Wey, Chin-Long

  • Author_Institution
    Dept. of Electr. Eng., Michigan State Univ., East Lansing, MI, USA
  • Volume
    27
  • Issue
    25
  • fYear
    1991
  • Firstpage
    2370
  • Lastpage
    2372
  • Abstract
    To achieve validation of correctness of the data converted from A/D convertors, a concurrent error detection (CED) scheme using time redundancy technique is applied to switched-capacitor based current-mode A/D convertor. The proposed design is capable of detecting all transient faults and most permanent faults that occur in switches.
  • Keywords
    analogue-digital conversion; error detection; fault location; redundancy; switched capacitor networks; A/D convertors; ADC; concurrent error detection; current-mode; permanent faults; switched-capacitor; time redundancy technique; transient faults;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19911468
  • Filename
    121365