Comparison of IC conducted emission measurement methods

Author

Fiori, Franco ; Musolino, Francesco

Author_Institution

Dept. of Electr. Eng., Politecnico di Torino, Italy

Volume

52

Issue

3

fYear

2003

fDate

6/1/2003 12:00:00 AM

Firstpage

839

Lastpage

845

Abstract

This paper deals with the electromagnetic emissions of integrated circuits. In particular, four measurement techniques to evaluate integrated circuit conducted emissions are described in detail and they are employed for the measurement of the power supply conducted emission delivered by a simple integrated circuit composed of six synchronous switching drivers. Experimental results obtained by employing such measurement methods are presented and the influence of each test setup on the measured quantities is discussed.

Keywords

TEM cells; electromagnetic compatibility; electromagnetic interference; integrated circuit measurement; EMC; EMI; IC conducted emission measurement methods; TEM cell method; electromagnetic emissions; integrated circuits; magnetic probe method; power supply conducted emission; synchronous switching drivers; test setup; Electromagnetic measurements; Integrated circuit measurements; Magnetic field measurement; Measurement techniques; Packaging; Power measurement; Power supplies; Probes; Sections; TEM cells;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/TIM.2003.814685

Filename

1213670