Title :
Comparison of IC conducted emission measurement methods
Author :
Fiori, Franco ; Musolino, Francesco
Author_Institution :
Dept. of Electr. Eng., Politecnico di Torino, Italy
fDate :
6/1/2003 12:00:00 AM
Abstract :
This paper deals with the electromagnetic emissions of integrated circuits. In particular, four measurement techniques to evaluate integrated circuit conducted emissions are described in detail and they are employed for the measurement of the power supply conducted emission delivered by a simple integrated circuit composed of six synchronous switching drivers. Experimental results obtained by employing such measurement methods are presented and the influence of each test setup on the measured quantities is discussed.
Keywords :
TEM cells; electromagnetic compatibility; electromagnetic interference; integrated circuit measurement; EMC; EMI; IC conducted emission measurement methods; TEM cell method; electromagnetic emissions; integrated circuits; magnetic probe method; power supply conducted emission; synchronous switching drivers; test setup; Electromagnetic measurements; Integrated circuit measurements; Magnetic field measurement; Measurement techniques; Packaging; Power measurement; Power supplies; Probes; Sections; TEM cells;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.2003.814685
